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    • 专利摘要:
    The task is to improve the functionality of an examination probe (10) while the examination probe (10) is being miniaturized. An examination probe (10) used in a periodontal pocket examination apparatus comprises a light emitting portion (10A) and a grasping portion (10B). The light emitting section (10A; 130A) comprises a crystal deflector (11; 14) that deflects measurement light, which is split from a low-coherence light, in a specific direction, and an f-θ lens to deflect the measurement light (LM), which deflects was to parallelize. Measurement light (LM) made parallel such as a measurement light beam (B1) is emitted from an opening (16) of the light emitting portion (10A) and irradiates a gum or a tooth of a subject. An optical tomography image of the gums or the tooth is generated from interference signals obtained based on the reflected light and allows the depth of a periodontal pocket to be determined. The light emitting section (10A) protrudes further than the gripping section (10B) in the emission direction of the measuring light (LM) such as the measuring light beam (B1). Thus, the measurement light, such as the measurement light (B1), is able to irradiate the periodontal pocket perpendicularly with respect to the depth direction of the pocket, avoiding the hand holding the gripping portion (10B) from having the tooth, gum or the like comes into contact.
    公开号:CH714914B1
    申请号:CH01163/19
    申请日:2018-02-16
    公开日:2021-10-15
    发明作者:Shindo Mikio
    申请人:Tanita Seisakusho Kk；
    IPC主号:
    专利说明:

    Technical area
    This invention relates to a periodontal pocket examination device.
    State of the art
    The measurement of the depth of a periodontal pocket is carried out as an example of the examination of periodontal disease. In general, the depth of periodontal pockets is measured visually, as if by a dentist inserting a rod-like measuring instrument called a "pocket probe" into the periodontal pocket. However, the measurement result may not necessarily be accurate due to the degree of skill of the dentist or the like, the insertion angle of the pocket probe, and a visual defect, and so on. There is also concern that affected areas that are free of periodontal disease may become infected with periodontal disease at the time of examination due to bleeding gums. For these reasons, non-invasive measurement of the depth of a periodontal pocket using an optical coherence tomography diagnostic apparatus has been considered (Patent Documents 1, 2).
    State-of-the-art documents:
    Patent documents:
    Patent Document 1: Japanese Patent Application Laid-Open Number 2009-131313 Patent Document 2: Japanese Patent Application Laid-Open Number 2009-148337
    In order to be able to measure the depth of a periodontal pocket with an optical interference tomography diagnostic device, miniaturization is required because this is necessary in order to introduce an examination probe into the patient's oral cavity. However, the inventors have found that in the technique described in Patent Documents 1 and 2, the inspection probe itself is quite large due to the use of a galvanomirror. The inventors have also found that it is difficult to ensure the accuracy of measurement due to noises which are generated and which are attributable to vibrations or the like when the drive system of the galvanomirror is driven.
    The inventors have further recognized that it is desirable to improve the functionality of the examination probe because it is preferred that the measurement light is emitted perpendicular to the depth direction of the periodontal pockets in order to measure the depth of the periodontal pockets accurately.
    Disclosure of the invention
    An object of the present invention is to improve the operability of an examination probe while the examination probe is being miniaturized.A periodontal pocket examination apparatus according to the present invention is characterized by comprising: an optical splitter for dividing low coherence light into measurement light and reference light; a crystal deflector on which the measurement light split by the optical splitter is incident to deflect the incident measurement light in a specific direction (or on the specific direction side) according to an applied voltage and to emit the deflected measurement light; a parallelizing element for directing the measurement light emitted from said crystal deflecting element into parallel light; a photodetector for detecting reflected light and for outputting an interference signal, wherein the reflected light is reflected measurement light that is generated by a gum or a tooth due to the irradiation of the gums or the tooth with the measurement light and the reflected reference light aligned by said parallelizing element, which is split off from said optical splitter and reflected from a reference surface is reflected; periodontal pocket data generating means for generating data on the depth of a periodontal pocket based on the interference signal output from said photodetector; and an inspection probe including said crystal deflecting member, said parallelizing member and a gripping portion, the gripping portion extending from a side surface of a light emitting portion for emitting the measurement light collimated by the paralleling member from an opening, the light emitting portion in the emission direction of the Measuring light protrudes further than the gripping portion.
    The light-emitting portion of the examination probe can be configured so that it is freely deformable, so that the light-emitting portion of the examination probe is deformed when a force is exerted on the light-emitting portion of the examination probe in the direction opposite to the emission direction of the measurement light, and returns to the pre-deformed shape when the force applied to the light emitting portion of the inspection probe is released.
    The examination probe may be freely deformable so that the light emitting portion of the examination probe is deformed at an upper and lower portion of the opening of the light emitting portion when a force is applied over at least a portion in the width direction in the direction opposite to the emission direction and returns to the shape prevailing before the deformation when the force applied to the light emitting portion of the inspection probe is released.
    At least a part of the upper portion and the lower portion is made of an elastic member so that a front side of the light emitting portion is able to be brought into close contact with a gum or tooth.
    For example, the crystal deflecting element deflects the incident measuring light in such a way that the deflection width of the measuring light emitted by the light-emitting section of the examination probe is sufficient for a measurement of the depth of a periodontal pocket in a single scan.
    For example, the periodontal pocket data generating means generates data on the depth of a periodontal pocket based on the interference signal output from the photodetector by using the examination probe to take a measurement at at least two locations at positions differing in height in a case in which the deflection width of the measuring light emitted from the light-emitting portion of the examination probe is less than a sufficient deflection width for a measurement of the depth of a periodontal pocket in a single scan.
    The apparatus further comprising an optical tomographic image generation means for generating at least two optical tomographic images based on interference signals output from the photodetector by using the examination probe to take a measurement at at least two locations at positions in its Differentiate height includes, in a case where the deflection width of the measurement light emitted from the light emitting portion of the examination probe is less than a sufficient deflection width for a measurement of the depth of a periodontal pocket in a single scan. For example, in this case, the periodontal pocket data generating means generates data relating to the depth of a periodontal pocket by combining and processing at least two optical tomographic images generated by an optical tomographic image generating means.
    Preferably, a position corresponding to the light emitting portion of the measurement light emitted from the light emitting portion is marked on the outside of the light emitting portion except for its front side.
    For example, the opening of the examination probe or the front of the light emitting portion of the examination probe has the shape of a square, a circle, a rectangle whose side in the vertical direction is shorter than the side in the longitudinal direction, or an ellipse whose longitudinal direction is the major axis and whose vertical direction is the minor axis.
    The grasping portion includes a neck portion and a base end portion and, when the base end portion extends from a side surface of the light emitting portion of the examination probe by means of the neck portion, the neck portion curves in the direction opposite to the direction of light emission and protrudes in the direction opposite to that In the direction of light emission, or the light emitting portion protrudes in the direction of light emission more than the neck portion, or one end of the neck portion is attached to a rear end of the light emitting portion on a side surface thereof and the other end of the neck portion protrudes in the direction of Light emission farther than one end of the neck portion, or at least one of an upper end portion and a lower end portion of the neck portion are cut away.
    For example, the inspection probe is such that a straight line in the longitudinal direction along which the gripping portion of the inspection probe extends and a straight line in the direction of the measurement light before it is deflected by the crystal deflector are not parallel.
    For example, the inspection probe is such that a straight line in the longitudinal direction along which the gripping portion of the inspection probe extends and a straight line in the direction of the measurement light before it is deflected by the crystal deflector may be orthogonal.
    The apparatus may further comprise a voltage circuit for applying the above-mentioned voltage to the crystal deflector. In this case, it is preferable that, on the one hand, when the voltage applied by the voltage circuit is a positive voltage, the crystal deflector deflects the measurement light more strongly in the specific direction depending on an increase in the positive voltage and when that applied by the voltage circuit Voltage is a negative voltage, the crystal deflector deflects the measurement light more in the direction opposite to the specific direction in response to an increase in the negative voltage.
    The light-emitting section of the examination probe can have a transparent plate. In this case, it is preferable that the transparent plate is fixed at a position that is inward of the opening of the light emitting portion in the direction opposite to the direction of light emission.
    According to the present invention, since the measurement light is deflected by the crystal deflector, the inspection probe can be miniaturized as compared with a case where the measurement light is deflected using a galvanomirror that requires a drive unit. Furthermore, in the examination probe, the light-emitting section, which emits the parallelized measuring light from the opening, protrudes further than the gripping section along the direction of emission of the measuring light.
    Therefore, when the user such as a dentist inserts the examination probe into the oral cavity of the measurement object such as a patient by grasping the grasping portion, the fingers holding the grasping portion can be prevented from breaking the teeth, etc. touch of the object, and the operability of the examination probe can also be improved.
    Brief description of the drawings
    Fig. 1 is a block diagram illustrating the construction of a periodontal pocket examining apparatus; Fig. 2 illustrates the manner in which the measurement light is deflected; 3 illustrates the manner in which measurement light is deflected; Fig. 4 is a perspective view of an examination probe; Fig. 5 illustrates the manner in which a gum and a tooth are irradiated with measurement light; Figs. 6A to 6E are examples of an interference signal; Fig. 7 is an example of an optical tomographic image of a gum and a tooth; Fig. 8 is an example of measurement light deflected by a crystal deflector; 9 illustrates the manner in which a gum and a tooth are irradiated with measurement light; Figs. 10A and 10B are examples of an interference signal; Fig. 11A is a perspective view of an examination probe and Fig. 11B is a sectional view taken along the line XIB-XIB of Fig. 11A; Fig. 12A is a perspective view of an examination probe and Fig. 12B is a sectional view taken along the line XIIB-XIIB of Fig. 12A; Figs. 13A and 13B are perspective views of an examination probe; 14A illustrates the manner in which a roll angle is detected, FIG. 14B illustrates the manner in which a shear angle is detected, and FIG. 14C illustrates the manner in which a pitch angle is detected; and Figs. 15A to 15D are perspective views of examination probes.
    Best way to carry out the invention
    Fig. 1 illustrating an embodiment of the present invention is a block diagram showing the construction of a periodontal pocket examining apparatus.
    Light of low coherence L is emitted from a light source 1 such as an SLD (super light emitting diode). The low coherence light L is split by a beam splitter (optical splitter) 2 into a measuring light LM and a reference light LR. It will suffice if the low coherence light L is emitted from a light source 1, and another light source such as a gas laser, a semiconductor laser or a laser diode can be used.
    The measuring light LM, which is split off by the beam splitter 2, strikes an examination probe 10. The examination probe 10 comprises a crystal deflection element 11, a concave lens 12 and an f-θ lens 13. (Although the f-θ lens is a parallelizing element one more element is sufficient if it is able to make the light emitted by the crystal deflecting element 11 parallel.)
    The measurement light (LM) incident on the examination probe 10 is incident on a crystal deflector 11. An electrode 11A is formed on the upper side of the crystal deflector 11, and an electrode 11B is formed on the lower side of the crystal deflector 11. When a voltage is applied from the voltage circuit 15 to the electrodes 11A and 11B, the crystal deflector 11 deflects the incident measurement light LM and emits it according to the applied voltage so that the light is emitted in a specific direction after deflection (it will suffice when the light is emitted from a specific direction, not a specific direction, after being deflected on the side.). The “specific direction” (or “on the side of a specific direction”) refers to a direction perpendicular to the direction of the measurement light before it is deflected. If we let the direction from left to right, or the direction perpendicular to the plane of the drawing, and the vertical direction be the X-axis, Y-axis and Z-axis in FIG 11 will be the positive direction along the X-axis, and the specific direction along which the measurement light is deflected by the crystal deflector 11 will be any direction in the plane of the X- and Z-axes. In this embodiment, it is assumed that the measurement light is deflected along the positive and negative directions of the Z-axis. The specific direction inherited from the light after it is deflected is not limited to a direction along which the light after it is deflected will be parallel to a specific direction; it will be sufficient if the light is even slightly deflected in a specific direction after the deflection. For example, if the measuring light LM moving along the positive direction of the X-axis is deflected with a deflection angle of 90 degrees (If the deflection angle were actually 90 degrees, the measuring light LM would not be the gum or tooth after deflection which is the measurement object; therefore, the deflection angle would be greater than -90 degrees and less than 90 degrees), then the measurement light is deflected in a direction parallel to the Z-axis. However, the deflection is not limited to such a case, since it suffices if the measuring light LM is deflected so that it is inclined more in the direction indicated by the Z-axis than that of the X-axis even if the deflection angle is smaller than 90 is degrees (even if the deflection angle is 1 degree).
    The crystal deflector 11 refers to an element that applies a voltage to a crystal and deflects incident light according to the applied voltage, and it may be either an acousto-optic element that deflects incident light by the acousto-optic effect or an electro-optic one Element that deflects incident light through the electro-optical effect, use can be made. An example of an acousto-optic element is to use a crystal such as dihydrogen glass or quartz, and an example of the electro-optic element is to use a KTN crystal which is an oxide crystal composed of calcium (K). Tantalum (Ta) and niobium (Nb) or a barium borate crystal. The light deflecting effect of the KTN crystal affects the deflection component in the direction of the internal electric field. Accordingly, in a case where the KTN crystal is used as the crystal deflector 11, the deflecting direction of the low coherence light emitted from the light source 1 and the direction of the electric field caused by the voltage impressed on the KTN crystal is set such that the direction of the electric field generated by the voltage impressed on the KTN crystal and the deflection direction of the low coherence light emitted from the light source 1 coincide. In this embodiment, it is assumed that the KTN crystal is used as the crystal deflector 11.
    The measuring light LM deflected by the crystal deflecting element 11 hits the concave lens 12. Since the KTN crystal itself has the function of a convex lens, a convex lens effect accidentally arises. The concave lens 12 is provided to cancel the convex lens effect.
    The measurement light LM transmitted through the concave lens 12 is made parallel by the f-θ lens 13 (parallelizing element), and irradiates a gum GU and a tooth TO to be measured. The measuring light LM, which is reflected by the gums GU and tooth TO, passes through the interior of the examination probe 10, is reflected in the beam splitter 2 and strikes a photodiode 4 (photodetector).
    Furthermore, the reference light that is split off in the beam splitter 2 is transmitted to a reference mirror 3 (reference surface), which is freely movable in the direction of propagation of the reference light LR and in the opposite direction (along the positive and negative direction of the Z- Axis in the embodiment shown in Fig. 1). The reflected reference light LR passes through the beam splitter 2 and hits the photodiode 4.
    When, by moving the reference mirror 3, equality is established between a propagation distance which is the sum total of the propagation distance traveled until the measurement light LM irradiates the gum GU and the tooth TO to be examined and the propagation distance which has been traveled , until the light reflected from the gums GU and tooth TO to be examined hits a photodiode 4, and a propagation distance that is the total sum of the propagation distance that has been covered until the reference light LR irradiates the reference mirror 3 and the light reflected from the reference mirror 3 is incident the photodiode 4 is incident, then interference occurs between the measurement light LM and the reference light LR, and the photodiode 4 outputs an interference signal.
    The interference signal output from the photodiode 4 is input to a signal processing circuit 5 (periodontal pocket data generating means), and signals representing tomographic optical images of the gums GU and the tooth TO (data on the depth of a periodontal pocket) are generated. By inputting the generated signals, which represent optical tomography images, into a display unit 6, the optical tomography images of the gums GU and the tooth TO are displayed on the display screen of the display unit 6. The processing for extracting the contours of the optical tomographic images is carried out in the signal processing circuit 5, and the depth of a periodontal pocket between the gum GU and the tooth TO is calculated. The calculated depth of the periodontal pocket is also displayed on the display screen of the display unit 6. Although optical tomographic images are generated and the depth of a periodontal pocket is calculated from the generated optical tomographic images, an arrangement can be adopted in which, instead of optical tomographic images, numerical data representing the depth of the periodontal pocket is used (such numerical data are also referred to as data regarding the depth of the periodontal pocket) and calculated in the signal processing circuit 5. The depth of the periodontal pocket is displayed on the display screen of the display unit 6.
    FIG. 2 illustrates the manner in which the measurement light LM is deflected by the crystal deflector 11. In Fig. 2, the concave lens 12 has been omitted.
    When voltage is applied to the crystal deflector 11 by the voltage circuit 15, the measurement light LM incident on the crystal deflector 11 is deflected. The deflection angle of the measurement light LM in the crystal deflector 11 differs depending on the voltage applied to the crystal deflector 11; The higher the voltage, the more the measuring light is deflected. For example, when a positive voltage is applied, the measuring light LM is deflected along the positive direction of the Z-axis, as indicated by the symbols B1 (measuring light beam B1). If there is applied a positive voltage that is lower than the positive voltage that is effective in the case where the measuring light beam B1 is obtained, then the measuring light LM with a deflection angle smaller than that of the measuring light beam B1 along the deflected positive direction of the Z-axis, as indicated by the symbols B2 (measuring light beam B2). When no voltage is applied, the measuring light LM is not deflected, as indicated by the symbols B3 (measuring light beam B3). Furthermore, by applying a negative voltage, the measuring light LM is deflected along the negative direction of the Z-axis, as indicated by the symbols B5 (measuring light beam B5). If there is applied a negative voltage lower than that effective in the case where the measurement light beam B5 is obtained, the measurement light LM with a deflection angle smaller than that of the measurement light beam B5 becomes along the negative Direction of the Z-axis deflected, as indicated by the symbols B4 (measuring light beam B4). Although there are of course an infinite number of measuring light beams obtained by deflecting with the crystal deflector 11, five measuring light beams B1 to B5 are shown to facilitate understanding.
    Due to the crystal deflection element 11, the measuring light thus has a deflection in a specific direction after the deflection (in FIG. 2, the positive direction and the negative direction along the Z-axis are directions that are perpendicular to the direction of the X-axis, which corresponds to the direction of the measuring light LM before it is deflected), as shown in the manner of the measuring light beams B1 to B5 in FIG. 2. Furthermore, the deflection of the measuring light by the crystal deflection element 11 can also be carried out in such a way that the measuring light LM before the deflection and the measuring light beams B1 to B5 after the deflection all lie in the same plane.
    The measuring light beams B1 to B5 are made parallel by the f-θ lens 13 so as to be parallel to the measuring light LM that prevailed before the deflection by the crystal deflector 11. (The thus parallelized measuring light beams B11, B21, B31, B41 and B51 do not necessarily irradiate both the gum GU and the tooth TO; depending on the irradiated position, there is a measuring light beam that irradiates the tooth TO, but not the gum GU For example, because the gum GU is not present at the position irradiated with the measuring light beam B11, the measuring light beam B11 irradiates the tooth TO but not the gum GU). The depth Δd of a periodontal pocket PP is calculated based on the reflected light rays. As shown in Fig. 2, the measuring light beams deflected by the crystal deflector 11 are denoted by symbols B1, B2, B3, B4 and B5, and the measuring light beams made parallel by the f-θ lens 13 are denoted by symbols B11, B21, B31, Designated B41 and B51.
    In Fig. 2, the deflection angle is increased by increasing the voltage applied to the crystal deflector 11. However, as an example of a technique for improving the angular range over which deflection is possible, it is also possible to adjust the length of the crystal deflector 11 (length along the direction of the X-axis which is the direction traversed by the measurement light LM) to enlarge.
    3 illustrates a modification of a crystal deflector 14.
    In the crystal deflector 14 shown in Fig. 3, a first reflecting mirror 14C is formed on the surface on which the measurement light LM is incident, and a second reflecting mirror 14D is formed on the surface from which the measurement light is incident LM is emitted. The lower end of the light incident surface (the surface on the left in Fig. 3) of the crystal deflector 14 does not have the first reflecting mirror 14C formed thereon and serves as a window 14E. The upper end of the light emitting surface (the surface on the right side in FIG. 3) of the crystal deflector 14 does not have the second reflecting mirror 14D formed thereon and serves as a window 14F.
    When a voltage is applied to the electrodes 14A and 14B respectively formed on the upper and lower surfaces of the crystal deflector 11, the measurement light LM that has impinged on the crystal deflector 14 through the window 14E of the incident surface becomes within of the crystal deflector 14, and is then reflected by the second reflecting mirror 14D formed on the light emitting surface. The measurement light LM reflected by the second reflecting mirror 14D is deflected within the crystal deflector 14, and then is reflected by the first reflecting mirror 14C formed on the light incident surface. Thus, while the reflection by the first reflecting mirror 14C and the second reflecting mirror 14D is repeated, the light is deflected and emitted from the window 14F on the light emitting side. As the propagation distance within the crystal deflector 14 is increased, the deflection angle increases.
    It goes without saying that the deflection angle is also changed in the crystal deflector 14 shown in FIG. 3 by changing the applied voltage.
    4 is a perspective view seen from the front of the examination probe 10.
    As mentioned above, the inspection probe 10 includes the crystal deflector 11, the concave lens 12, and the f-θ lens 13. However, instead of the concave lens 12 that is provided, the f-θ lens 13 may be a lens such as an aspherical one Be a lens that has the function of a concave lens 12. That is, it will suffice if the arrangement is such that the concave lens 12 and the f-θ lens 13 correct the characteristic of the crystal deflector 11 and parallel light beams are obtained.
    The examination probe 10 includes a light emitting portion 10A and a grasping portion 10B. The gripping portion 10B extends from the right side surface 26 (one side surface) of the light emitting portion 10A.
    An opening 16 is formed on a front side 21 of the light emitting portion 10A (on the side from which the measuring light beams B11 to B51 are emitted, as described with reference to FIG. 2). A transparent plate 17 is built into the opening 16. The opening 16 is in the shape of a rectangle as seen from the front (the side of the front 21 in Fig. 4 is taken as the front), the side being shorter than in the vertical direction (the direction along the Z-axis) the side in the longitudinal direction (the direction along the Y-axis). The measuring light beams B1 to B5 that have been deflected and made parallel are emitted from the opening 16.
    The light emitting portion 10A protrudes from the gripping portion 10B along the emission direction of the measurement light beams B1 to B5 (the positive direction along the X-axis). Even if the user such as a dentist grips the grasping portion 10B, inserts the examination probe 10 into the oral cavity of the object such as a patient and tries to bring the front surface 21 of the light emitting portion 10A into contact with the gum GU or tooth TO to be examined to bring, the fingers of the user holding the gripping portion 10B will not easily touch the gum GU and the examining tooth TO. In a case where the front side 21 of the light emitting portion 10A makes contact for the purpose of examination, the angle (direction) of light emission is easier to adjust to make the tooth TO and the gum GU perpendicular to the measurement light beams B11, B21, B31, Irradiate B41 and B51 as compared with a case where such contact is not made.
    5 illustrates the manner in which the gums GU to be examined and the tooth TO to be examined are irradiated with the measuring light beams B11, B21, B31, B41 and B51. FIG. 5 is enlarged in comparison to FIG. 2.
    In Fig. 5, the gums GU and the tooth TO can be seen from the side. The left side in Fig. 5 corresponds to either the outside or the inside of the body, and the right side corresponds to the other side of either the outside or the inside of the body.
    As mentioned above, the periodontal pocket PP is formed between the gum GU and the tooth TO. In the case of severe periodontal disease, the depth of the PP periodontal pocket is 6 mm or more. Therefore, if the deflection width ΔL of the measuring light beams B11 to B51 (deflection width of the measuring light beams B11 to B51 along the depth direction of the periodontal pocket PP) is 6 mm or more, it can be determined whether the periodontal pocket PP has severe periodontal disease. Accordingly, the selection of the crystal deflector 11 and the voltage applied thereto are decided in such a way that the deflection width ΔL of the measuring light beams B11 to B51 are 6 mm or more. Thus, sufficient deflection width to measure the depth of a periodontal pocket in a single scan is preferred.
    Figs. 6A to 6E are examples of interference signals.
    6A, 6B, 6C, 6D and 6E are respectively examples of interference signals obtained based on the measurement light beams B11, B21, B31, B41 and B51.
    The measuring light beam B11 directly irradiates the portion of the tooth TO in which the gum GU does not exist (see Fig. 5), and the intensity of the light reflected from the surface of the tooth TO increases. Therefore, based on the light reflected from the surface of the tooth TO, an interference signal is generated at time t11 as illustrated in FIG. 6A.
    Since the measuring light beam B21 irradiates the upper end of the periodontal pocket PP (see Fig. 5), the intensity of the light increases from the surface of the gums GU, from the boundary between the gums GU and the periodontal pocket PP, and from the Surface of the tooth TO is reflected on. As illustrated in FIG. 6B, therefore, interference signals are generated at times t21, t22 and t23 based on the light emitted from the surface of the gum GU, from the boundary between the gum GU and the periodontal pocket PP, and from the surface of the tooth TO is reflected, generated. A time difference Δt21 from time t21 to time t22 indicates a thickness Δ21 of the gums GU at the portion irradiated with the measurement light beam B21, and a time difference Δt22 from time t22 to time t23 shows a distance Δ22 across the gap (the distance above the space between the tooth TO and the gum GU) of the periodontal pocket PP at the section that is irradiated by the measuring light beam B21.
    Similarly, as illustrated in Fig. 6C, interference signals are generated at times t31, t32 and t33 based on the light emitted from the surface of the gum GU, from the boundary between the gum GU and the periodontal pocket PP, and from the surface of the tooth TO is reflected, or generated due to the irradiation with the measuring light beam B31. A time difference Δt31 from time t31 to time t32 indicates a thickness Δ31 of the gums GU at the portion irradiated with the measurement light beam B31, and a time difference Δt32 from time t32 to time t33 shows a distance Δ32 across the gap of the periodontal pocket PP at the portion irradiated by the measuring light beam B31.
    Similarly, as illustrated in Fig. 6D, interference signals are generated at times t41, t42 and t43 based on the light emitted from the surface of the gum GU, from the boundary between the gum GU and the periodontal pocket PP, and from the surface of the tooth TO is reflected, or generated due to the irradiation with the measuring light beam B41. A time difference Δt41 from time t41 to time t42 indicates a thickness Δ41 of the gums GU at the portion irradiated with the measurement light beam B41, and a time difference Δt42 from time t42 to time t43 shows a distance Δ42 across the gap of the periodontal pocket PP at the portion irradiated by the measuring light beam B41.
    No periodontal pocket has formed on the portion of the gum that is irradiated with the measuring light beam B51 (see FIG. 5). Based on the light reflected from the gum GU and from the surface of the tooth TO due to the irradiation with the measurement light beam B5, the interference signals, as illustrated in FIG. 6E, are therefore generated at the times t51 and t52. A time difference Δt51 from time t51 to time t52 indicates a thickness Δ51 of the gums GU at the portion irradiated with the measurement light beam B5.
    Tomographic optical images of the gums GU and the tooth TO shown in Fig. 7 are generated by plotting the peak values of the interference signals of Figs. 6A to 6E.
    Fig. 7 is an example of a tomographic optical image Igu of the gum GU and a tomographic optical image Ito of the tooth TO.
    The tomographic optical image Igu of the gum GU and the tomographic optical image Ito of the tooth TO are displayed on the display screen of the display unit 6. The depth Δd of a periodontal pocket PP is calculated in the signal processing circuit 5 by contour extraction of the optical tomography image Igu of the gum GU and the optical tomography image Ito of the tooth TO in the signal processing circuit 5.
    In this embodiment, the depth Δd of a periodontal pocket PP is calculated by generating the optical tomography images Igu and Ito of the gums GU and the tooth TO and by extracting the contours of the generated optical tomography images Igu and Ito. However, as will be described below, the depth Δd of a periodontal pocket PP can be calculated by calculation without generating the tomographic optical images Igu and Ito (although the tomographic optical images Igu and Ito can be generated as well).
    8 illustrates the measuring light beams BB1 and BB2 deflected by the crystal deflector 11.
    It is assumed that the measuring light beams BB1 and BB2 have the maximum deflection angle resulting from the crystal deflection element 11. If we let θ be the deflection angle of the measurement light beams BB1 and BB2, then the deflection width ΔL of the measurement light beams BB1 and BB2 which is at a position spaced a distance m along the light emission direction from a reference point x0 before the deflection becomes ΔL = 2m be tanθ.
    9 illustrates the manner in which the gum GU to be examined and the tooth TO to be examined are irradiated with the measuring light beams Bt and Bb. FIG. 9 corresponds to FIG. 5.
    The measuring light beam Bt irradiates a position which corresponds to the upper end of the periodontal pocket PP, and the measuring light beam Bb irradiates a position which corresponds to the lower end of a periodontal pocket PP. The distance from the position which is irradiated with the measuring light beam Bt to the position which is irradiated with the measuring light beam Bb corresponds to the depth Δd of the periodontal pocket PP.
    Fig. 10A is an example of an interference signal obtained based on the measurement light beam Bt, and Fig. 10B is an example of an interference signal obtained based on the measurement light beam Bt and the measurement light beam Bb.
    Since the measuring light beam Bt irradiates the tooth TO and not the gum GU, an interference signal is generated at a point in time tt1 due to the reflection from the tooth TO. Since the measuring light beam Bb irradiates the gum GU and not the tooth TO, an interference signal is generated at a time tbl due to the reflection from the gum GU, and an interference signal is generated at a time tb2 due to the reflection from the tooth TO.
    Correspondingly, as was described above with reference to FIG. 8, if we let T represent the time span from the emission of the measuring light beam BB1 with the maximum deflection angle to the emission of the measuring light beam BB2 with the maximum deflection angle (let this time span be a period) , then T: ΔL = (tb2 - tt1): Δd. Therefore, the depth Δd of a periodontal pocket is calculated from Δd = {ΔL · (tb2 - tt1)} / T. Thus, the depth of the periodontal pocket Δd can be calculated even if the tomographic optical image Igu of the gum GU and the tomographic optical image Ito of the tooth TO are not always generated. It goes without saying that the calculation of the depth of the periodontal pocket Δd can be carried out by the signal processing circuit 5.
    In the embodiment set out above, it is assumed that the deflection width of the measuring light beams B11 to B51 is sufficient to enable the depth Δd of a periodontal pocket PP to be measured in a single scan, even in a case of severe periodontal disease. However, in cases where there is not enough deflection width to allow the measurement of the depth Δd of a periodontal pocket in a single scan, an arrangement can be adopted in which, by making multiple measurements at locations at positions that are different in height distinguish (at least two positions), data on the depth Δd of a periodontal pocket are generated in the signal processing circuit 5 (periodontal pocket data generating means) based on interference signals output from the photodiode 4.
    For example, it is assumed that the examination probe 10 can emit measuring light having a deflection width corresponding to the area from the measuring light beam B11 to B31 (equal to the area from B31 to B51), which is shown in FIG. 5 by a single scan ( Measurement) is illustrated. First of all, it can be assumed that a first scan (measurement) is carried out by the examination probe 10 at locations at positions where the measurement light can be emitted, specifically over an area corresponding to the measurement light beams B11 to B31 shown in FIG. 5. In this case, in the first scan, the optical tomography images Igu and Ito of the upper end of the gingiva GU and the tooth TO shown in FIG. 5 are made up of interference signals based on measurement light that is transmitted over the area shown in FIG. 5 from the measurement light beam B11 to B31 is emitted. Next, the inspection probe 10 is moved downward. Assume that on the basis of a second scan which is carried out at a position of the probe after such a movement, measuring light is emitted by the examination probe 10 over the area shown in FIG. 5 from the measuring light beam B31 to B51. In this case, in the second scan, the optical tomography images Igu and Ito of the lower half of the gingiva GU and the tooth TO shown in FIG. 5 are made up of interference signals based on measurement light that is emitted from the measurement light beam B31 to B51 over the area shown in FIG. 5 is received. By combining the two tomographic optical images Igu and Ito obtained by measurement made in two places at positions different in height and the processing in the signal processing circuit 5, those shown in FIG. 5 become optical Obtained tomographic images of the gums GU and the tooth TO. Needless to say, the tomographic optical images Igu and Ito of the upper half of the gum GU and the tooth TO and the tomographic optical images Igu and Ito of the lower half of the gum GU and the tooth TO are combined to be related to the overlapping portions thereof and the connectivity of the tomographic optical images in the vertical direction is ensured to obtain tomographic optical images identical to the Igu and Ito optical tomographic images that would be obtained from a single scan.
    Figures 11A and 11B illustrate a modification of an examination probe.
    Fig. 11A, which corresponds to Fig. 4, is a perspective view of an examination probe 30 as seen from the front, and Fig. 11B is a sectional view taken along the line XIB-XIB of Fig. 11A.
    The examination probe 30 includes a light emitting portion 30A and a grasping portion 30B.
    The light emitting portion 30A is a rectangular frame when viewed from the front. Attached to the rectangular frame is a cover 41 that is freely slidable along the emission direction of the measurement light emitted from the light emitting portion 30A and along the direction opposite therefrom. The transparent plate 37 is fixed at a position that is inward of an opening 36 located in the negative direction of the X-axis on the front side of the cover 41. The measuring light beams made parallel are emitted from the opening 36 along the positive direction of the X-axis through the above-mentioned transparent plate 37.
    As illustrated in Fig. 11B, the inside of the cover 41 is formed to have a recess 42 that is shaped so that a front surface 38 of the frame of the light emitting portion 30A fits therein. A compression spring 43 is attached between the front 38 of the frame of the light emitting portion 30A and an inner wall 44 of the recess 42. When a force is applied to the cover 41 along the negative direction of the X-axis, a repulsive force due to the compression spring 43 acts along the positive direction of the X-axis. Thus, the light emitting portion 30A of the examination probe 30 shown in FIGS. 11A and 11B is freely deformable so that the light emitting portion 30A is deformed when a force is applied to the light emitting portion 30A along the negative direction of the X-axis, which is is opposite to the positive direction along the X-axis which is the direction in which the parallelized measurement light is emitted and returns to the shape prevailing before the deformation when the force applied to the light emitting portion of the inspection probe is released. The portion of the cover 41 on the inside of the light emitting portion 30A is shorter along the negative direction of the X-axis than the portion on the outside of the light emitting portion 30A. Even if the cover 41 is moved along the negative direction of the X-axis, the transparent plate 37 will not hinder the movement of the cover 41 because the transparent plate 37 and the cover 41 do not come into contact.
    In the embodiment shown in Fig. 11, due to the fact that the cover 41 is subjected to a force in the direction opposite to the emission direction of the parallelized measurement light, the entire cover 41 is deformed in this opposite direction. That is, when the cover 41 is intended to be part of the light emitting portion 30A, it is assumed that the entire frame of the light emitting portion 30A (examination probe 30) is deformed when a force is applied in the direction opposite to the emission direction of the parallelized measurement light. On the other hand, an arrangement may be provided in which a cover is attached to a part of the upper portion and to a part of the lower portion of the light emitting portion 30A, and the cover attached to these portions is deformed. Thus, the upper portion of the opening 36 of the light emitting portion 30A (the “upper portion” referring to the upper portion in a case where the longitudinal direction of the inspection probe 30 and the emission direction of the measurement light are both assumed to be horizontal) and the lower thereof Section (the “lower section” refers to the lower section in a case where the longitudinal direction of the examination probe 30 and the emission direction of the measurement light are both assumed to be horizontal) freely deformable so that they deform when a force is applied in the Direction (the negative direction along the X-axis), which is opposite to the direction (the positive direction along the X-axis) in which the parallelized measurement light is emitted, over at least a portion (e.g. over a Length greater than that of tooth TO along the width direction) in the width direction [which is the positive direction along de r is the Y-axis in Fig. 11A, taking the longitudinal direction of the inspection probe 30 as the width direction] and returns to the pre-deformed shape when the applied force is released.
    Due to the fact that the portions of the light emitting portion 30A are freely deformable, the front side of the light emitting portion 30A (cover 41) can be brought into close contact with the gum GU and the tooth TO of the object.
    With the inspection probe 10 shown in Fig. 4, the longitudinal direction of the gripping portion 10B becomes the direction (positive direction along the Y-axis) perpendicular to the emission direction (positive direction along the X-axis) of the measurement light emitted from the opening 16, taken. With the embodiment shown in FIGS. 11A and 11B, however, the longitudinal direction of the gripping portion 30B is not the direction (positive direction along the Y-axis) perpendicular to the emission direction (positive direction along the X-axis) of the measurement light emitted from of the opening 36, but instead leans in a direction (negative direction along the X-axis) opposite to the emission direction (positive direction along the X-axis) of the measurement light emitted from the opening 36. Thus, the gripping portion 30B leans in the direction opposite to the emission direction of the measurement light. Therefore, when the gripping portion 30B is held, it is more difficult for the fingers holding the gripping portion 30B to touch the gum GU or the tooth TO, and it is easier to keep the front of the light emitting portion 30A in close contact with the gum GU and to bring the tooth TO.
    12A and 12B show a further example of an examination probe 60, FIG. 12A being a perspective view of the examination probe 60 and FIG. 12B being a sectional illustration along the illustrated line XIIB-XIIB of FIG. 12A.
    A light emitting portion 60A is composed of a frame, the entire front of which is made of a freely deformable resin portion 68 such as rubber. The resin portion 68 is also freely deformable so that it is deformed in a case when a force acts in the direction (the negative direction along the X-axis) opposite to the emission direction (the positive direction along the X-axis) of the parallelized measurement light , and returns to the shape that existed before the deformation when the applied force is released. A transparent plate 67 is fixed at a position inward of an opening 66 located in front of the resin portion 68 in the negative direction of the X-axis. As a result, the deformation of the resin portion 68 is not restricted by the transparent plate 67.
    In the examination probe 60 shown in FIGS. 12A and 12B, parts of the upper and lower portions of the opening 66 of the light emitting portion 60A may be formed as resin portions 68. Thus, the resin portion 68 is formed over at least a portion (e.g., a length greater than that of the tooth TO along the width direction) in the width direction (Y-axis direction) and is freely deformable so that it is deformed, when a force is applied in the direction (the negative direction along the X-axis) opposite to the direction (the positive direction along the X-axis) in which the parallelized measurement light is emitted, and returns to the shape that before deformation prevailed when the applied force is released.
    The front side of the light emitting portion 60A can be brought into close contact with the gum GU and the tooth TO even in the case where resin is used as portions of the light emitting portion 60A.
    In Figs. 11A and 11B, the compression spring 43 is used. Although a resin is used in FIGS. 12A and 12B, it goes without saying that another material can be used if it is an elastic member that deforms when a force is applied and returns to the shape that it was before Deformation prevailed when the applied force is released.
    Both the light emitting portion 30A in Figs. 11A and 11B and the light emitting portion 60A in Figs. 12A and 12B are rectangles when viewed from the front, but may as well be circles. Even in the case of a light emitting portion that is a circle viewed from the front, it can be arranged to be deformed in a manner similar to that described above when a force acts in the direction opposite to the emission direction of the measurement light and returns to the shape that existed before the deformation when the applied force is released. In a case where the front side of the light emitting portion or the opening formed in the light emitting portion is a circle, the upper side relative to the horizontal plane passing through the center of the circle is the upper portion of the light emitting portion or the opening, and the lower side relative to the horizontal plane is the lower portion of the light emitting portion or the opening.
    Figs. 13A and 13B illustrate another embodiment and are perspective views of an examination probe 70. Fig. 13A is a perspective view viewed from the front, and Fig. 13B is a perspective view viewed from the rear.
    The examination probe 70 includes a light emitting portion 70A and a grasping portion 70B. A first angle sensor 81, a second angle sensor 82, and a third angle sensor 83 are embedded in a top plate 72, a side plate 73, and a back plate 74 of the light emitting portion 70A, respectively. If we make a roll angle θr represent the angle around the X axis, a pitch angle θp represent the angle around the Y axis, and a yaw angle θy represent the angle around the Z axis, then the first angle sensor 81 becomes the yaw angle θy, the The second angle sensor 82 detects the pitch angle θp and the third angle sensor 83 detects the roll angle θr.
    14A illustrates the manner in which the roll angle θr is detected, FIG. 14B illustrates the manner in which the yaw angle θy is detected, and FIG. 14C illustrates the manner in which the Pitch angle θp is detected.
    14A is a front view of the examination probe 70.
    When the longitudinal direction of the examination probe 70 coincides with the direction of the Y-axis, as indicated by the solid line, the roll angle θr of the examination probe 70 will be 0 degrees. When the examination probe 70 is tilted about the X-axis as indicated by the dashed line, the roll angle θr is established. When a front side 71 of the light emitting portion 70A of the examination probe 70 is parallel to the gum GU or the tooth TO, interference signals are generated by the measurement light reflected from the gum GU and the tooth TO. As a result, the depth Δd of the periodontal pocket PP can be measured accurately. On the other hand, if the front side 71 of the light emitting portion 70A of the examination probe 70 is not parallel to the gum GU or the tooth TO, there is a possibility that interference signals by using the measurement light reflected from the gum GU or tooth TO will not can be generated. As a result, there is a possibility that the depth Δd of the periodontal pocket cannot be accurately measured, for example, an erroneous depth is measured as the depth Δd of the periodontal pocket. Furthermore, when the vertical direction of the examination probe 70 and the direction of the depth Δd of the periodontal pocket do not coincide, there is a possibility that the depth Δd of the periodontal pocket cannot be measured accurately.
    Since the roll angle θr is detected by the third angle sensor 83, the surveyor is able to grasp whether the vertical direction of the inspection probe 70 and the direction of the depth Δd of the coincide. It goes without saying that a signal indicating the roll angle θr detected by the third angle sensor 83 is also input to the signal processing circuit 5 of the third angle sensor 83 and displayed on the display screen of the display unit 6. Furthermore, an arrangement can be assumed in which notification of an optimal roll angle is provided by another notification method, for example by outputting a sound, light (for example switching on a light-emitting diode) or a vibration.
    The roll angle θr of the examination probe 70 with the front side 71 of the light emitting portion 70A of an examination probe 70 facing the gum GU and the tooth TO in parallel will be different according to the angle of the face of the object, or more precisely, the angle of the gum GU and the To distinguish tooth TO. Therefore, by way of example, the roll angle θr of the examination probe 70 with the front side 71 of the light emitting portion 70A of an examination probe 70 facing the gum GU and the tooth TO in parallel can be calculated by detecting the inclination angle of the chair in which the object is seated. Alternatively, a specific roll angle θr of the examination probe 70 may be used as the roll angle θr of the examination probe 70 with the front side 71 of the light emitting portion 70A of the examination probe 70 facing the gum GU and the tooth TO in parallel.
    Figure 14B is a top view of the examination probe 70.
    When the longitudinal direction of the examination probe 70 coincides with the direction of the Y-axis as indicated by the solid line, the yaw angle θy of the examination probe 70 will be 0 degrees. When the examination probe 70 is tilted about the Z-axis, as indicated by the dashed line, the yaw angle θy is established. When the front side 71 of the light emitting portion 70A of the examination probe 70 faces the gum GU and the tooth TO in parallel, interference signals are generated by the measurement light reflected from the gum GU or the tooth TO in a manner similar to that described above. generated. As a result, the depth Δd of the periodontal pocket PP can be measured accurately. On the other hand, if the front side 71 of the light emitting portion 70A of the examination probe 70 does not face the gum GU and the tooth TO in parallel, there is a possibility that interference signals by using the measurement light reflected from the gum GU or tooth TO will not can be generated. As a result, there is a possibility that the depth Δd of the periodontal pocket cannot be accurately measured, for example, an erroneous depth is measured as the depth Δd of the periodontal pocket.
    Since the yaw angle θy is detected by the first angle sensor 81, it is possible to understand whether the front side 71 of the light emitting portion 70A of the examination probe 70 faces the gum GU or the tooth TO in parallel. It goes without saying that a signal indicating the yaw angle θy detected by the first angle sensor 81 is also input to the signal processing circuit 5 from the first angle sensor 81 and displayed on the display screen of the display unit 6.
    14C is a left side view of the examination probe 70.
    When the measurement light emitted from the light emitting portion 70A of the examination probe 70 coincides with the positive direction of the X-axis as indicated by the solid line, the pitch angle θp of the examination probe 70 will be 0 degrees. When the examination probe 70 is tilted about the Y-axis, as indicated by the dashed line, the pitch angle θp is established. When the front side 71 of the light emitting portion 70A of the examination probe 70 faces the gum GU and the tooth TO in parallel, interference signals are generated by the measurement light reflected from the gum GU or the tooth TO in a manner similar to that described above. generated. As a result, the depth Δd of the periodontal pocket PP can be measured accurately. On the other hand, if the front side 71 of the light emitting portion 70A of the examination probe 70 does not face the gum GU and the tooth TO in parallel, there is a possibility that interference signals by using the measurement light reflected from the gum GU or tooth TO will not can be generated. As a result, there is a possibility that the depth Δd of the periodontal pocket cannot be accurately measured, for example, an erroneous depth is measured as the depth Δd of the periodontal pocket.
    Since the pitch angle θp is detected by the second angle sensor 82, it is possible to grasp whether the front side 71 of the light emitting portion 70A of the examination probe 70 faces the gum GU or the tooth TO in parallel. It goes without saying that a signal indicating the pitch angle θp detected by the second angle sensor 82 is also input to the signal processing circuit 5 from the second angle sensor 82 and displayed on the display screen of the display unit 6.
    An arrangement may be provided in which, when the yaw angle θy and pitch angle θp are detected, notification of an optimal yaw angle θy and pitch angle θp is made by another notification method such as outputting a sound, light (for example, turning on a Light emitting diode) or a vibration.
    The yaw angle θy and pitch angle θp of the examination probe 70 with the front side 71 of the light emitting portion 70A of the examination probe 70 facing the gum GU and the tooth TO in parallel become each other according to the angle of the object's face, or more precisely, the angle of the gums GU or the tooth TO. Therefore, by way of example, the yaw angle θy and pitch angle θp of the examination probe 70 with the front side 71 of the light emitting portion 70A of an examination probe 70 facing the gum GU and the tooth TO in parallel can be calculated by detecting the inclination angle of the chair in which the object is seated . Alternatively, a specific yaw angle θy and pitch angle θp of the examination probe 70 may be used as the yaw angle θy and pitch angle θp of the examination probe 70 with the front side 71 of the light emitting portion 70A of the examination probe 70 facing the gum GU and the tooth TO in parallel.
    13A and 13B, the marks 91, 92 and 93 are provided on the upper plate 72, the back plate 74 and the lower plate 75 of the light emitting portion 70A at positions corresponding to the positions of emission of the measurement light emitted from the opening 76 of the light emitting portion 70A. The positions at which the marks 91, 92 and 93 are provided correspond more precisely to the position with respect to the longitudinal direction (width direction) of the examination probe 70 at which the measurement light is emitted. By looking at the markings 91, 92 and 93, the user, like a dentist, can determine the position of the emission of the measurement light even when the user cannot see the front side 71 of the light emitting portion 70A. By looking at the marks 91, 92 and 93, the user like a dentist can grasp the position of emission of the measurement light emitted from the light emitting portion 70A of the examination probe 70 and can accurately calculate the depth of the periodontal pocket PP.
    Although the marks 91, 92 and 93 are formed on the upper plate 72, the rear plate 74 and the lower plate 75 of the light emitting portion 70A in FIGS. 13A and 13B, they can be formed on any of the upper plates 72, the back plate 74 and the lower plate 75 or at any two locations. Furthermore, an arrangement can be adopted in which a mark indicating the position of emission of the measurement light is provided on the front side 71 of the light emitting portion 70A. A mark can thus be provided on the outer surface of the light emitting portion 70A (the mark can be provided on the outer surface except the front side 71 of the light emitting portion 70A). Further, although the marks indicating the position corresponding to the position of emission of the measurement light are shown triangular in FIGS. 13A and 13B, they may have other shapes such as simple lines or notches. Furthermore, an LED (light emitting diode) or the like can be provided at the position corresponding to the position of emission of the measurement light and used as a marker indicating the position of emission of the measurement light. In any case, it will suffice if the position of the emission of the measuring light can be determined.
    Although the light emitting portion 70A of the examination probe 70 shown in FIGS. 13A and 13B is a rectangular parallelepiped when viewed from the front, it may be a circular cylinder or a hemisphere when viewed from the front. Even if the light emitting portion 70A is cylindrical or hemispherical, the outer surface of the light emitting portion 70A other than the outer surface of the front side 71 may be provided with the marks at positions corresponding to the positions of emission of the measurement light emitted from the light emitting portion will.
    15A to 15D illustrating examples of an examination probe are perspective views seen from the front. A neck portion is formed in each of the probes of Figures 15A to 15D. Measurement light is emitted from the opening 16 through the transparent plate 17 in all of FIGS. 15A to 15D.
    Referring to Fig. 15A, an inspection probe 100 includes a light emitting portion 100A and a base end portion 100B. The base end portion 100B extends from the right side (one side) of the light emitting portion 100A via a neck portion 100C. The neck portion 100C, which curves in the direction opposite to the direction of emission of the measurement light from the light emitting portion 100A, protrudes in the direction opposite to the direction of emission of the measurement light. The base end portion 100B and the neck portion 100C correspond to a gripping portion.
    Referring to Fig. 15B, an examination probe 110 includes a light emitting portion 110A and a base end portion 110B. The base end portion 110B extends from the right side (one side) of the light emitting portion 110A via a neck portion 110C. The base end portion 110B and the neck portion 110C correspond to a gripping portion. The light emitting portion 110A protrudes further than the neck portion 110C along the emission direction of the measurement light from the light emitting portion 110A. Even in a case where the light emitting portion 110A protrudes further than a part of the gripping portion and not the entire gripping portion in the emission direction of the measurement light, it is considered that the light emitting portion 110A protrudes further than the gripping portion.
    Referring to Fig. 15C, an examination probe 120 includes a light emitting portion 120A and a base end portion 120B. The base end portion 120B extends from the right side (one side) of the light emitting portion 120A via a neck portion 120C. The base end portion 120B and the neck portion 120C correspond to a gripping portion. The neck portion 120C is attached to one end of the right side of the light emitting portion 120A at the rear end portion thereof, and extends in the direction of the other end in the emission direction of the measurement light from the light emitting portion 120A. The other end of the neck portion 120C is attached to the base end portion 120B.
    Referring to Fig. 15D, an examination probe 130 includes a light emitting portion 130A and a base end portion 130B. The base end portion 130B extends from the right side (one side) of the light emitting portion 130A via a neck portion 130C. The base end portion 130B and the neck portion 130C correspond to a gripping portion. The upper end portion and the lower end portion of the neck portion 130C are cut away, one end of the neck portion 130C is attached to the central portion of the right side of the light emitting portion 130A at the rear end portion thereof, and the other end of the neck portion 130C is to the central portion of the left side of the light emitting portion 130A is attached to the rear end portion thereof. In Fig. 15D, the upper and lower end portions of the neck portion 130C are cut away. However, either the upper end portion or the lower end portion can be cut off.
    As illustrated in Figures 15A to 15D, the base end portions 100B, 110B, 120B and 130B may extend from the light emitting portion 100A, 110A, 120A or 130A through the neck portion 100C, 110C, 120C or 130C.
    In FIGS. 15A to 15D, the light-emitting portions 100A, 110A, 120A or 130A have the shape of a parallelepiped, but they can just as well be cylindrical or hemispherical. The opening 16 or the front of the light emitting portion 100A, 110A, 120A or 130A may be a square, a rectangle, a circle, a rectangle whose side in the vertical direction is shorter than that in the longitudinal direction, or an ellipse whose longitudinal direction is the Major axis and whose vertical direction is the minor axis. The front of the light emitting portion 100A, 110A, 120A or 130A can be a circle or an ellipse, and the opening 16 can be a rectangle, the front of the light emitting portion 100A, 110A, 120A or 130A can be a rectangle, and the opening 16 can be a circle or be an ellipse. Furthermore, the neck portions 100C, 110C, 120C or 130C need not necessarily be provided between the light emitting portions 100A, 110A, 120A or 130A and the base end portions 100B, 110B, 120B and 130B, respectively. It will suffice if the straight line along the longitudinal direction of the examination probe and the straight line along the emission direction of the measurement light emitted from the light emitting portions 100A, 110A, 120A or 130A (the straight line along the direction of the measurement light before it is deflected by the crystal deflector ) is emitted, are not parallel. Furthermore, the straight line along the longitudinal direction of the examination probe and the straight line along the emission direction of the measurement light emitted from the light emitting portion 100A, 110A, 120A or 130A can be substantially perpendicular, and the straight line along the longitudinal direction of the Examination probe and a surface that is parallel to the direction of the deflection width of the measurement light emitted from the light emitting portion 100A, 110A, 120A, or 130A is substantially perpendicular.
    Description of symbols
    1 light source, 2 beam splitter, 3 reference mirror, 4 photodiode, 5 signal processing circuit, 6 display unit, 10 examination probe, 10A light emitting section, 10B gripping section, 11 crystal deflector, 11A electrode, 11B electrode, 12 concave lens, 13 f-θ lens, 14 crystal deflector, 14A electrode, 14B electrode, 14C first reflective mirror, 14D second reflective mirror, 14E ... window, 14F window, 15 voltage circuit, 16 aperture, 17 transparent plate, 21 front, 26 right side, 30 examination probe, 30A light emitting section , 30B gripping portion, 36 opening, 37 transparent plate, 38 front side, 41 cover, 42 recess, 43 compression spring, 44 inner wall, 51 cover, 60 examination probe, 60A light emitting portion, 66 opening, 67 transparent plate, 68 resin portion, 70 examination probe, 70A light emitting section, 70B gripping section, 71 front panel, 72 top panel, 73 side panel, 74 back panel, 75 bottom right plate, 76 opening, 81 first angle sensor, 82 second angle sensor, 83 third angle sensor, 91 mark, 92 mark, 93 mark, 100 examination probe, 100A light emitting section, 100B gripping section, 100C neck section, 110 examination probe, 110A light emitting section, 110B gripping section, 110C neck section, 120 examination probe, 120A light emitting section, 120B gripping section, 120C neck section, 130 examination probe, 130A light emitting section, 130B gripping section, 130C neck section, B1 measuring light beam, B2 measuring light beam, B3 measuring light beam, B4 measuring light beam, B5 measuring light beam, B11 measuring light beam, B21 measuring light beam, B31 measuring light beam, B41 measuring light beam, B51 measuring light beam, GU gums, L light of low coherence, LM measuring light, LR reference light, PP periodontal pocket, TO tooth, θp pitch angle, θr roll angle, θy yaw angle
    权利要求:
    Claims (15)
    [1]
    1. Periodontal pocket examination device that has:an optical splitter (2) for splitting light of low coherence into measurement light (LM) and reference light (LR);a crystal deflecting element (11; 14) onto which the measuring light (LM), which is split off by the optical splitter (2), for deflecting the incident measuring light (LM) in a specific direction according to an applied voltage and for emitting the deflected measuring light ( LM), occurs;a parallelizing element (13) for aligning the measuring light (LM) emitted from the crystal deflecting element (11; 14) into parallel light;a photodetector (4) for detecting reflected light and for outputting an interference signal, wherein the reflected light is reflected measurement light (LM) that is generated by a gum (GU) or tooth (TO) due to the irradiation of the gum (GU) or tooth (TO ) is reflected with the measuring light (LM) which is aligned in parallel by said parallelizing element (13) and is reflected reference light (LR) which is split off by the optical splitter (2) and reflected by a reference surface (3);periodontal pocket data generating means for generating data on a depth of a periodontal pocket (PP) based on the interference signal output from the photodetector (4); andan examination probe (10; 30; 60; 70; 100; 110; 120; 130) which comprises the crystal deflecting element (11; 14), the parallelizing element (13) and a gripping section (10B; 30B; 60B; 70B; 100B; 110B; 120B; 130B), the gripping portion (10B; 30B; 60B; 70B; 100B; 110B; 120B; 130B) extending from one side of a light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) for emitting the measuring light (LM) made parallel by the parallelizing element (13) from an opening, the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) in the emission direction of the Measuring light (LM) protrudes further than said gripping section (10B; 30B; 60B; 70B; 100B; 110B; 120B; 130B).
    [2]
    2. Periodontal pocket examination device according to claim 1, wherein the light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is so configured is that it is freely deformable so that the light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130), is deformed when a force is applied to the light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) in the direction of emission of the measuring light (LM) is exerted in the opposite direction and returns to the shape prevailing before the deformation when the light emitting section (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130), the force exerted is released.
    [3]
    3. Periodontal pocket examination device according to claim 2, wherein the light-emitting section (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10) is freely deformable, so that the light-emitting section (10A; 30A; 60A; 70A ; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) at a lower portion and an upper portion of the opening of the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) is deformed when a force is exerted over at least a portion in a width direction, in a direction opposite to the emission direction of the measurement light (LM), and returns to the shape prevailing before the deformation when the the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is released.
    [4]
    4. The periodontal pocket examination apparatus according to claim 3, wherein at least a part of the upper portion and the lower portion is made of an elastic member so that a front side of the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) in tight Contact with a gum (GU) or tooth (TO) can be brought.
    [5]
    5. Periodontal pocket examination device according to one of claims 1 to 4, further comprising an angle sensor (81; 82; 83) for detecting at least one of the angles of roll angle, pitch angle and yaw angle of the examination probe (10; 30; 60; 70; 100; 110; 120 ; 130)
    [6]
    6. Periodontal pocket examination device according to one of claims 1 to 5, wherein by the crystal deflection element (11; 14), the incident measuring light (LM) can be deflected in a manner that the deflection width of the measuring light (LM) emitted by the light-emitting section (10A ; 30A; 60A; 70A; 100A; 110A; 120A; 130A) the examination probe (10; 30; 60; 70; 100; 110; 120; 130) emitted is sufficient for the measurement of the depth of a periodontal pocket (PP) in a single scan is.
    [7]
    7. Periodontal pocket examination device according to one of claims 1 to 5, wherein the periodontal pocket data generating means is designed such that data relating to the depth of a periodontal pocket (PP) based on interference signals received from the photodetector (4) by using the examination probe (10; 30; 60; 70; 100; 110; 120; 130) can be generated in order to carry out measurements at at least two locations at positions which differ in their height, in a case in which the deflection width of the measuring light (LM), which is emitted from the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is less than a sufficient deflection width for measuring the depth of a periodontal pocket (PP) in a single scan.
    [8]
    8. Periodontal pocket examination apparatus according to claim 7, further comprising an optical tomographic image generation means for generating at least two optical tomographic images based on interference signals from the photodetector (4) by using the examination probe (10; 30; 60; 70; 100; 110; 120 ; 130) are outputted to perform measurements at at least two locations at positions differing in height in a case where the deflection width of the measurement light (LM) emitted from the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is less than a sufficient deflection width for measuring the depth of a periodontal pocket (PP) in a single Scan;The periodontal pocket data generation means can generate data relating to the depth of a periodontal pocket (PP) by combining and processing at least two optical tomography images that have been generated by the optical tomography image generation means.
    [9]
    9. Periodontal pocket examination device according to one of claims 1 to 8, wherein a position corresponding to a light emitting position of the measurement light (LM) emitted from the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) is emitted, is marked on the outside of the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A).
    [10]
    10. Periodontal pocket examination device according to one of claims 1 to 9, wherein the opening of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) or the front side of the light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) have the shape of a square, a circle, a rectangle whose side in the vertical direction is shorter than the side in the width direction , or an ellipse whose width direction is the major axis and whose vertical direction is the minor axis.
    [11]
    11. Periodontal pocket examination device according to one of claims 1 to 10, wherein the gripping portion (10B; 30B; 70B; 100B; 110B; 120B; 130B) has a base end portion (100B; 110B; 120B; 130B) and a neck portion (100C; 110C; 120C; 130C) includes;wherein the base end portion (100B; 110B; 120B; 130B) extends from one side of the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110 ; 120; 130) extends over the neck portion (100C; 110C; 120C; 130C); andwherein the neck portion (100C; 110C; 120C; 130C) curves in the direction opposite to the direction of light emission and protrudes in the direction opposite to the direction of light emission, or the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) protrudes further in the direction of light emission than the neck portion (100C; 110C; 120C; 130C), or one end of the neck portion (100C; 110C; 120C; 130C) is at a rear end of the light emitting portion (10A; 30A ; 60A; 70A; 100A; 110A; 120A; 130A) on one side surface thereof, and the other end of the neck portion (100C; 110C; 120C; 130C) protrudes further in the direction of light emission than the one end of the neck portion (100C; 110C; 120C; 130C), or at least one of a lower end portion and an upper end portion of the neck portion (100C; 110C; 120C; 130C) are cut away.
    [12]
    12. Periodontal pocket examination device according to one of claims 1 to 11, wherein the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is such that a straight line in the longitudinal direction along which the gripping portion (10B; 30B; 70B; 100B; 110B; 120B; 130B) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) and a straight line in the direction of the measuring light (LM) before being deflected by the Crystal deflector (11; 14), are not parallel.
    [13]
    13. Periodontal pocket examination device according to one of claims 1 to 11, wherein the examination probe (10; 30; 60; 70; 100; 110; 120; 130) is such that a straight line in the longitudinal direction along which the gripping portion (10B; 30B; 70B; 100B; 110B; 120B; 130B) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130) extends, and a straight line in the direction of the measuring light (LM), before being deflected by the crystal deflector (11; 14), are perpendicular.
    [14]
    14. Periodontal pocket examination device according to one of claims 1 to 13, further comprising a voltage circuit (15) for impressing the applied voltage in the crystal deflection element (11; 14);wherein, on the one hand, when the applied voltage impressed by the voltage circuit (15) is a positive voltage, the crystal deflector (11; 14) deflects the measuring light (LM) more in the specific direction in response to an increase in the positive voltage, andwhen the applied voltage impressed by the voltage circuit (15) is a negative voltage, the crystal deflector (11; 14) deflects the measurement light (LM) more in the direction opposite to the specific direction in response to an increase in the negative voltage.
    [15]
    15. Periodontal pocket examination device according to one of claims 1 to 14, wherein the light-emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) of the examination probe (10; 30; 60; 70; 100; 110; 120; 130 ) has a transparent plate (17; 37; 67); andthe transparent plate (17; 37; 67) is fixed at a position opposite to the opening of the light emitting portion (10A; 30A; 60A; 70A; 100A; 110A; 120A; 130A) in a direction opposite to the direction of light emission lies inside.
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    同族专利:
    公开号 | 公开日
    JP2018149223A|2018-09-27|
    DE112018001372T5|2019-11-21|
    US20200000568A1|2020-01-02|
    JP6778435B2|2020-11-04|
    WO2018168314A1|2018-09-20|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    JP2009131313A|2007-11-28|2009-06-18|Sun Tec Kk|Optical tomography image displaying method|
    JP5565910B2|2011-01-21|2014-08-06|日本電信電話株式会社|Optical deflector|
    JP2013233303A|2012-05-09|2013-11-21|J Morita Tokyo Mfg Corp|Dental measurement device|
    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    JP2017049420A|JP6778435B2|2017-03-15|2017-03-15|Periodontal pocket inspection device|
    PCT/JP2018/005381|WO2018168314A1|2017-03-15|2018-02-16|Periodontal pocket inspection device|
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